? 2008 ixys corporation,all rights reserved symbol test conditions maximum ratings v dss t j = 25 c to 150 c 600 v v dgr t j = 25 c to 150 c, r gs = 1m 600 v v gss continuous 30 v v gsm transient 40 v i d25 t c = 25 c52a i dm t c = 25 c, pulse width limited by t jm 208 a i a t c = 25 c52a e as t c = 25 c4j dv/dt i s i dm , v dd v dss , t j 150 c 20 v/ns p d t c = 25 c 735 w t j -55 ... +150 c t jm 150 c t stg -55 ... +150 c t l 1.6mm (0.062 in.) from case for 10s 300 c t sold plastic body for 10s 260 c m d mounting torque (ixfk) 1.13/10 nm/lb.in. f c mounting force (ixfx) 20..120 /4.5..27 n/lb. weight to-264 10 g plus247 6 g symbol test conditions characteristic values (t j = 25 c unless otherwise specified) min. typ. max. bv dss v gs = 0v, i d = 3ma 600 v v gs(th) v ds = v gs , i d = 8ma 3.0 5.5 v i gss v gs = 30v, v ds = 0v 200 na i dss v ds = v dss 25 a v gs = 0v t j = 125 c 3 ma r ds(on) v gs = 10v, i d = 0.5 ? i d25 , note 1 115 m ixfk52n60q2 IXFX52N60Q2 v dss = 600v i d25 = 52a r ds(on) 115m t rr 250ns ds98982b(05/08) hiperfet tm power mosfets q2-class n-channel enhancement mode avalanche rated, high dv/dt, low q g low intrinsic r g , low t rr features ? double metal process for low gate resistance ? international standard packages ? epoxy meet ul 94 v-0, flammability classification ? avalanche energy and current rated ? fast intrinsic rectifier advantages ? easy to mount ? space savings ? high power density advance technical information g = gate d = drain s = source tab = drain plus247 (ixfx) to-264 (ixfk) s g d (tab) (tab)
ixys reserves the right to change limits, test conditions, and dimensions. ixfk52n60q2 IXFX52N60Q2 symbol test conditions characteristic values (t j = 25 c unless otherwise specified) min. typ. max. g fs v ds = 10v, i d = 0.5 ? i d25 , note 1 30 40 s c iss 6800 pf c oss v gs = 0v, v ds = 25v, f = 1mhz 1000 pf c rss 225 pf t d(on) resistive switching times 23 ns t r v gs = 10v, v ds = 0.5 ? v dss , i d = 0.5 ? i d25 13 ns t d(off) r g = 1 (external) 56 ns t f 8.5 ns q g(on) 198 nc q gs v gs = 10v, v ds = 0.5 ? v dss , i d = 0.5 ? i d25 43 nc q gd 94 nc r thjc 0.17 c/w r thcs 0.15 c/w source-drain diode characteristic values t j = 25 c unless otherwise specified) symbol test conditions min. typ. max. i s v gs = 0v 52 a i sm repetitive, pulse width limited by t jm 208 a v sd i f = i s , v gs = 0v, note 1 1.5 v t rr 250 ns q rm 1 c i rm 10 a note 1: pulse test, t 300 s; duty cycle, d 2%. ixys mosfets and igbts are covered 4,835,592 4,931,844 5,049,961 5,237,481 6,162,665 6,404,065 b1 6,683,344 6,727,585 7,005,734 b2 7,157,338b2 by one or more of the following u.s. patents: 4,850,072 5,017,508 5,063,307 5,381,025 6,259,123 b1 6,534,343 6,710,405 b2 6,759,692 7,063,975 b2 4,881,106 5,034,796 5,187,117 5,486,715 6,306,728 b1 6,583,505 6,710,463 6,771,478 b2 7,071,537 to-264 (ixfk) outline millimeter inches min. max. min. max. a 4.82 5.13 .190 .202 a1 2.54 2.89 .100 .114 a2 2.00 2.10 .079 .083 b 1.12 1.42 .044 .056 b1 2.39 2.69 .094 .106 b2 2.90 3.09 .114 .122 c 0.53 0.83 .021 .033 d 25.91 26.16 1.020 1.030 e 19.81 19.96 .780 .786 e 5.46 bsc .215 bsc j 0.00 0.25 .000 .010 k 0.00 0.25 .000 .010 l 20.32 20.83 .800 .820 l1 2.29 2.59 .090 .102 p 3.17 3.66 .125 .144 q 6.07 6.27 .239 .247 q1 8.38 8.69 .330 .342 r 3.81 4.32 .150 .170 r1 1.78 2.29 .070 .090 s 6.04 6.30 .238 .248 t 1.57 1.83 .062 .072 dim. terminals: 1 - gate 2 - drain (collector) 3 - source (emitter) 4 - drain (collector) plus247 tm (ixfx) outline dim. millimeter inches min. max. min. max. a 4.83 5.21 .190 .205 a 1 2.29 2.54 .090 .100 a 2 1.91 2.16 .075 .085 b 1.14 1.40 .045 .055 b 1 1.91 2.13 .075 .084 b 2 2.92 3.12 .115 .123 c 0.61 0.80 .024 .031 d 20.80 21.34 .819 .840 e 15.75 16.13 .620 .635 e 5.45 bsc .215 bsc l 19.81 20.32 .780 .800 l1 3.81 4.32 .150 .170 q 5.59 6.20 .220 0.244 r 4.32 4.83 .170 .190 i f = 25a, -di/dt = 100a/ s v r = 100v, v gs = 0v advance technical information the product presented herein is under development. the technical specifications offered are derived from a subjective evaluation of the design, based upon prior knowledge and experience, and constitute a "considered reflection" of the anticipated result. ixys reserves the right to change limits, test conditions, and dimensions without notice.
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